High Temperature Test System for
Microwave Integrated Circuits

Overall view of high temperature test system for microwave integrated circuits

To save floor space the client decided to stack (2) eight cubic foot chambers on top of each other

The 19" racks hold bulk DC power supplies and card racks for DUT driver boards

View of Card Rack for DUT Driver Boards

Note use of copper bus bars at top and bottom for power distribution

Rear View of Cabling

Rear view of cabling from racks in chamber as they terminate at back of driver card racks

All cabling is rated for 175° C continuous operation

Side View of 19" Racks